Monday, February 23, 2009

Embedded NDE With piezoelectric wafer active sensors in aerospace applications .doc (Papaer Presentation)

ABSTRACT:

The capability of embedded piezoelectric wafer-active sensors (PWAS) to perform in-situ nondestructive evaluation (NDE) is explored in this article, which includes animations of PWAS interactions with Lamb modes. PWAS can satisfactorily perform Lamb wave transmission and reception, and crack detection in an aircraft panel with the pulse-echo method is illustrated. For large-area scanning, a PWAS phased array is used to create the embedded ultrasonic’s structural radar. For quality assurance, PWAS are self-tested using electromechanical impedance.

Embedded nondestructive evaluation (NDE) is an emerging technology that will allow for the transitioning from conventional ultrasonic’s methods to embedded systems structural health monitoring (SHM), such as those envisioned for the Integrated Vehicle Health Management (IVHM). Structural health monitoring for IVHM requires the development of small, lightweight, inexpensive, unobtrusive, minimally invasive sensors to be embedded in the airframe with minimum weight penalty and at affordable costs. Such sensors should be able to scan the



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